Facility for Printed Organic Electronics 

Scanning Electron Microscope - Jeol 7800-E Prime

Scanning Electron Microscope - Jeol 7800-E Prime

This Jeol SEM is designed for surface topology studies in high resolution. A state-of-the-art technology allows to maintain a high resolution, even at low acceleration voltages in order to minimize charging effects and electron beam damage of the sample.

  • Ultra-low acceleration imaging, down to 10V
  • Resolution down to 1nm
  • 5 detectors: 
    • LED: secondary electron detector
    • SRBED: backscatter electron detector
    • UED: in-lens detector with active filter
    • STEM: scanning transmission microscope mode
    • EDS: x-ray detector for elementary analysis
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Cluster 4: Electrical, Optical and Spectroscopic Characterization


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