Our site uses cookies necessary for its proper functioning. To improve your experience, other cookies may be used: you can choose to disable them. This can be changed at any time via the Cookies link at the bottom of the page.

Université de Bordeaux
ELORPrintTecEquipment of Excellence
Cluster of excellence
 
WelcomeFacilityCluster 4: Electrical, Optical and Spectroscopic Characterization

Cluster 4: Electrical, Optical and Spectroscopic Characterization

This cluster is dedicated to the characterization of materials and devices. The equipment allows to study material properties in bulk form, solution, thin film and in several type of device configurations. The focus lays on electrical and optical properties and surface morphology, but rheological properties and elementary analysis also belong to the possibilities.

Thin Film Analyzer - TFA 2000EThin Film Analyzer - TFA 2000E

The TF Analyzer 2000 is the most sophisticated analyzer of electroceramic material and devices. The test equipment allows different characterization methods: Ferroelectric standard testing Fast...

Four Point Probe - Lucas Signatone Pro4Four Point Probe - Lucas Signatone Pro4

The Pro4 provides a simple and reliable way to perform sheet and bulk resistivity measurements. The measurement is done via a computer controlled Keithley in order to measure in the ideal current...