Scanning Electron Microscope - Jeol 7800-E Prime

This Jeol SEM is designed for surface topology studies in high resolution. A state-of-the-art technology allows to maintain a high resolution, even at low acceleration voltages in order to minimize charging effects and electron beam damage of the sample.

• Ultra-low acceleration imaging, down to 10V
• Resolution down to 1nm
• 5 detectors: 
• LED: secondary electron detector
• SRBED: backscatter electron detector
• UED: in-lens detector with active filter
• STEM: scanning transmission microscope mode
• EDS: x-ray detector for elementary analysis