Université de Bordeaux
ELORPrintTecEquipment of Excellence
Cluster of excellence

Cluster 4: Electrical, Optical and Spectroscopic Characterization

This cluster is dedicated to the characterization of materials and devices. The equipment allows to study material properties in bulk form, solution, thin film and in several type of device configurations. The focus lays on electrical and optical properties and surface morphology, but rheological properties and elementary analysis also belong to the possibilities.

Thin Film Analyzer - TFA 2000EThin Film Analyzer - TFA 2000E

The TF Analyzer 2000 is the most sophisticated analyzer of electroceramic material and devices. The test equipment allows different characterization methods: Ferroelectric standard testing  Fast...

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