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Université de Bordeaux
ELORPrintTecEquipment of Excellence
Cluster of excellence
 
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Aude MansonFacility for Printed Organic Electronics

Administrative and financial management

StaffThursday 29 October 2015 by MANSON Aude. Last update Monday 14 October 2019
Thin Film Analyzer - TFA 2000EFacility for Printed Organic Electronics

The TF Analyzer 2000 is the most sophisticated analyzer of electroceramic material and devices. The test equipment allows different characterization methods: Ferroelectric standard testing Fast pulse switching tests Relaxation current measurement Self discharge testing The system can operate with different external equipment, such as oscilloscopes, temperature units, probing stations, high...

Cluster 4: Electrical, Optical and Spectroscopic CharacterizationMonday 07 October 2019 by SPAMPINATO Nicoletta. Last update Wednesday 09 October 2019
05/10/2018 - CNRS Facebook liveFacility for Printed Organic Electronics

https://lejournal.cnrs.fr/videos/revivez-notre-direct-dans-la-salle-blanche-elorprinttec

Press releasesMonday 07 October 2019 by MANSON Aude.
07/02/2017 - Sud-Ouest - Université de Bordeaux : un équipement d'excellence inauguré
07/02/2017 - Sud-Ouest - Université de Bordeaux : un équipement d'excellence inauguréFacility for Printed Organic Electronics 788 Kilo bytesPress releasesMonday 07 October 2019 by MANSON Aude. Last update Monday 07 October 2019
04/12/2011 - Sudouest - 13,3 millions pour hâter le passage vers l'industrie
04/12/2011 - Sudouest - 13,3 millions pour hâter le passage vers l'industrieFacility for Printed Organic Electronics 4 Mega bytesPress releasesFriday 10 April 2015 by PITOIS Caroline. Last update Monday 07 October 2019
Spectroradiometer - HAMAMATSU PMA-12Facility for Printed Organic Electronics

This Hamamatsu instrument is designed to characterize lightsources like OLED devices. The main functionalities are: spectrum measurement luminance measurement determination of the chromatic coordinates wavelength range: from 300 to 800 nm wavelength resolution: 3 nm

Cluster 4: Electrical, Optical and Spectroscopic CharacterizationTuesday 12 July 2016 by skhiev@enscbp.fr. Last update Monday 07 October 2019