The Jetlab 4 from Microfab is a single nozzle inkjet printer that can drive upto 4 printheads simultaneously. This tool is used for jetting tests on new ink formulations and the printing of small structures and devices. substrates upto 210x260mm substrate heating upto 90°C printhead heating upto 50°C x/y precision: 30um, repeatability: 20um z movement upto 50mm drop visualization...
Cluster 1: Advanced instrumentation for top-down and bottom-up processingTuesday 28 June 2016 by SMAAL Willem. Last update Thursday 21 July 2016This Lesker evaporator, housed in a glovebox, is dedicated to metal evaporation. It has 4 thermal as well as 4 e-beam sources. deposition from 1 to hundreds of nanometers size of the substrate: 100 x 100mm or 15 x 15 mm, can be adapted depending on requirements uniformity of deposition: <+/- 5% for 100x100mm co-evaporation for thermal sources possible substrate heating up to 150°C
Cluster 3: Ultra High Vacuum systems for thin film deposition, characterization and batch fabricationTuesday 12 July 2016 by SMAAL Willem. Last update Thursday 21 July 2016Slot-die printing is the technique that permits the best thickness uniformity over a large surface area, while being compatible with the high-throughput roll-to-roll technology. The ink is pushed in the narrow space between the lips of the die while the substrate moves underneath. It is especially useful for large area OLED lighting or depositing the stripes for organic photovoltaics. uniformity...
Cluster 5: Printing PilotsTuesday 28 June 2016 by SMAAL Willem. Last update Thursday 21 July 2016The Pro4 provides a simple and reliable way to perform sheet and bulk resistivity measurements. The measurement is done via a computer controlled Keithley in order to measure in the ideal current range. resistivity range: 1mOhm <-> 800kOhm accuracy: <1% maximum substrate size: 200mm mapping function
Cluster 4: Electrical, Optical and Spectroscopic CharacterizationTuesday 12 July 2016 by skhiev@enscbp.fr. Last update Thursday 21 July 2016This profilometer is used for layerthickness measurement and verification of small structures. It has an excellent precision over a large range of thicknesses and has several interesting options that make it a versatile and reliable tool. motorized x/y movement of 150 x 150mm and motorozed 360° rotation 150 mm diameter vacuum chuck for rigid or flexible substrates 50 um -> 55 mm travel...
Cluster 4: Electrical, Optical and Spectroscopic CharacterizationTuesday 12 July 2016 by skhiev@enscbp.fr. Last update Thursday 21 July 2016This Nikon optical microscope is an accessible routine inspection microscope that has all necessary powerfull options for the analysis of small features and cristal morphology. direct microscope objectives: x5, x10, x20, x50, long focal 5 million color CCD camera polarizer/analyzer filter prism DIC for differential interference contrast
Cluster 4: Electrical, Optical and Spectroscopic CharacterizationTuesday 12 July 2016 by skhiev@enscbp.fr. Last update Thursday 21 July 2016